Claire Fenouillet-Beranger: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

Bias-Engineered Mobility in Advanced FD-SOI MOSFETs

Fernandez, Cristina, Rodriguez, Noel, Ohata, Akiko, Gamiz, Francisco, Andrieu, Francois, Fenouillet-Beranger, Claire, Faynot, Olivier, Cristoloveanu, Sorin

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 429 KB

english, 2013

2

Characterization and modeling of capacitances in FD-SOI devices

Imed Ben Akkez, Antoine Cros, Claire Fenouillet-Beranger, P. Perreau, A. Margain, Frederic Boeuf, Francis Balestra, Gérard Ghibaudo

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 1.05 MB

english, 2012

3

Study of substrate orientations impact on Ultra Thin Buried Oxide (UTBOX) FDSOI High-K Metal gate technology performances

Ben Akkez, Imed, Fenouillet-Beranger, Claire, Cros, Antoine, Perreau, Pierre, Haendler, Sébatien, Weber, Olivier, Andrieu, François, Pellissier-Tanon, D., Abbate, F., Richard, C., Beneyton, R., Gourau

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 1.71 MB

english, 2013

4

New parameter extraction method based on split C–V measurements in FDSOI MOSFETs

Ben Akkez, Imed, Cros, Antoine, Fenouillet-Beranger, Claire, Boeuf, Frederic, Rafhay, Q., Balestra, Francis, Ghibaudo, Gérard

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 502 KB

english, 2013

5

[IEEE 2010 IEEE International SOI Conference - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International SOI Conference (SOI) - ESD robustness of FDSOI gated diode for ESD network design: Thin or thick BOX?

Benoist, Thomas, Fenouillet-Beranger, Claire, Perreau, Pierre, Buj, Christel, Galy, Philippe, Marin-Cudraz, David, Faynot, Olivier, Cristoloveanu, Sorin, Gentil, Pierre

Year:

2010

Language:

english

File:

PDF, 610 KB

english, 2010

6

[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Innovative high-density ESD protection device in state of the art UTBB FDSOI technologies

Fonteneau, Pascal, Solaro, Yohann, Marin-Cudraz, David, Legrand, Charles-Alexandre, Fenouillet-Beranger, Claire

Year:

2015

Language:

english

File:

PDF, 746 KB

english, 2015

7

Role of synaptic variability in resistive memory-based spiking neural networks with unsupervised learning

Ly, Denys Riwan Bunsothy, Grossi, Alessandro, Fenouillet-Beranger, Claire, Nowak, Etienne, Querlioz, Damien, Vianello, Elisa

Journal:

Journal of Physics D Applied Physics

Year:

2018

Language:

english

File:

PDF, 1.38 MB

english, 2018

8

Experimental investigation of ESD design window for fully depleted SOI N-MOSFETs

Thomas Benoist, Claire Fenouillet-Beranger, Pierre Perreau, Christel Buj, Philippe Galy, David Marin-Cudraz, Olivier Faynot, Sorin Cristoloveanu, Pierre Gentil

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 602 KB

english, 2011

9

New materials and device architectures for the end-of-roadmap CMOS nodes

Thomas Skotnicki, Frederic Boeuf, Robin Cerutti, Stephane Monfray, Claire Fenouillet-Beranger, Markus Muller, Arnaud Pouydebasque

Journal:

Materials Science and Engineering: B

Year:

2005

Language:

english

File:

PDF, 391 KB

english, 2005

10

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Novel back-biased UTBB lateral SCR for FDSOI ESD protections

Solaro, Yohann, Fonteneau, Pascal, Legrand, Charles-Alexandre, Fenouillet-Beranger, Claire, Ferrari, Philippe, Cristoloveanu, Sorin

Year:

2013

Language:

english

File:

PDF, 1.08 MB

english, 2013

11

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - Innovative ESD protections for UTBB FD-SOI technology

Solaro, Yohann, Fonteneau, Pascal, Legrand, Charles-Alexandre, Marin-Cudraz, David, Passieux, Jeremy, Guyader, Pascal, Clement, Laurent-Renaud, Fenouillet-Beranger, Claire, Ferrari, Philippe, Cristolo

Year:

2013

Language:

english

File:

PDF, 1.28 MB

english, 2013

12

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Si/SiGe Epitaxy and Selective Etch Applications for Advanced Thin-Films MOSFET Structures

Loubet, Nicolas, Boeuf, Frédéric, Monfray, Stéphane, Fenouillet-Beranger, Claire, Denorme, Stéphane, Bidal, Grégory, Skotnicki, Thomas, Dutartre, Didier

Year:

2008

Language:

english

File:

PDF, 2.48 MB

english, 2008

13

Selective SiGe Etching Formed by Localized Ge Implantation on SOI

Bourdon, Helene, Fenouillet-Béranger, Claire, Gallon, Claire, Coronel, Philippe, Lenoble, Damien

Journal:

Solid State Phenomena

Year:

2005

Language:

english

File:

PDF, 746 KB

english, 2005

14

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Ultra Compact FDSOI Transistors including Strain and Orientation: Processing and Performance

Fenouillet-Beranger, Claire, Pham Nguyen, Loan, Perreau, Pierre, Denorme, Stephane, Andrieu, Francois, Faynot, Olivier, Tosti, Lucie, Brevard, Laurent, Buj, Christel, Weber, Olivier, Gallon, Claire, F

Year:

2009

Language:

english

File:

PDF, 1.48 MB

english, 2009

15

Investigation of Mobility Enhancement Effect in Process-Induced Strained Ultrathin Silicon-on-Insulator Metal–Oxide–Semiconductor Field-Effect Transistors

Ohata, Akiko, Gallon, Claire, Fenouillet-Beranger, Claire, Cristoloveanu, Sorin

Journal:

Japanese Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 203 KB

english, 2008

16

[IEEE 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Washington DC, USA (2015.9.9-2015.9.11)] 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Thermal simulation of nanosecond laser annealing of 3D sequential VLSI

Mathieu, Benoit, Fenouillet-Beranger, Claire, Kerdiles, Sebastien, Barbe, Jean-Charles

Year:

2015

File:

PDF, 791 KB

2015

17

[IEEE 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Washington DC, USA (2015.9.9-2015.9.11)] 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Thermal simulation of nanosecond laser annealing of 3D sequential VLSI

Mathieu, Benoit, Fenouillet-Beranger, Claire, Kerdiles, Sebastien, Barbe, Jean-Charles

Year:

2015

Language:

english

File:

PDF, 791 KB

english, 2015

18

[IEEE 2015 International 3D Systems Integration Conference (3DIC) - Sendai, Japan (2015.8.31-2015.9.2)] 2015 International 3D Systems Integration Conference (3DIC) - Intermediate BEOL process influence on power and performance for 3DVLSI

Sarhan, Hossam, Thuries, Sebastien, Billoint, Olivier, Deprat, Fabien, De Sousa, Alexandre Ayres, Batude, Perrine, Fenouillet-Beranger, Claire, Clermidy, Fabien

Year:

2015

Language:

english

File:

PDF, 1.28 MB

english, 2015

19

[IEEE ESSDERC 2016 - 46th European Solid-State Device Research Conference - Lausanne, Switzerland (2016.9.12-2016.9.15)] 2016 46th European Solid-State Device Research Conference (ESSDERC) - Opportunities brought by sequential 3D CoolCube™ integration

Vinet, Maud, Batude, Perrine, Fenouillet-Beranger, Claire, Brunet, Laurent, Mazzochi, Vincent, Lu, Cao-Minh Vincent, Deprat, Fabien, Micout, Jessy, Previtali, Bernard, Besombes, Paul, Rambal, Nils, An

Year:

2016

Language:

english

File:

PDF, 4.67 MB

english, 2016

20

Dielectrics stability for intermediate BEOL in 3D sequential integration

Deprat, Fabien, Fenouillet-Beranger, Claire, Jousseaume, Vincent, Guerin, Chloé, Beugin, Virginie, Rochat, Névine, Licitra, Christophe, Caubet-Hilloutou, Véronique, Benoit, Daniel, Imbert, Gregory, Ra

Journal:

Microelectronic Engineering

Year:

2016

Language:

english

File:

PDF, 964 KB

english, 2016

21

Technological enhancers effect on Ni 0.9 Co 0.1 silicide stability for 3D sequential integration

Deprat, Fabien, Nemouchi, Fabrice, Fenouillet-Beranger, Claire, Rodriguez, Philippe, Joblot, Sylvain, Gregoire, Magali, Barge, David, Gergaud, Patrice, Rambal, Nils, Batude, Perrine, Vinet, Maud

Journal:

Physica status solidi

Year:

2016

Language:

english

File:

PDF, 443 KB

english, 2016

22

[IEEE 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Bochum, Germany (2017.7.3-2017.7.5)] 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Transistor Temperature Deviation Analysis in Monolithic 3D Standard Cells

Brocard, Melanie, Mathieu, Benoit, Colonna, Jean-Philippe, Santos, Cristiano, Fenouillet-Beranger, Claire, Cao-Minh, Vincent Lu, Cibrario, Gerald, Brunet, Laurent, Batude, Perrine, Andrieu, Francois,

Year:

2017

Language:

english

File:

PDF, 1.08 MB

english, 2017

23

(Invited) 3D Monolithic Integration

Brunet, Laurent, Batude, Perrine, Fenouillet-Beranger, Claire, Vinet, Maud

Journal:

ECS Transactions

Year:

2018

Language:

english

File:

PDF, 460 KB

english, 2018

24

[IEEE 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Granada (2018.3.19-2018.3.21)] 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Investigation on built-in BJT in FD-SOI BIMOS

Bedecarrats, Thomas, Galy, Philippe, Fenouillet-Beranger, Claire, Cristoloveanu, Sorin

Year:

2018

Language:

english

File:

PDF, 640 KB

english, 2018

25

Impact of low thermal processes on reliability of high-k/metal gate stacks

Tsiara, Artemisia, Garros, Xavier, Lu, Cao-Minh Vincent, Fenouillet-Béranger, Claire, Ghibaudo, Gerard

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2017

Language:

english

File:

PDF, 1.63 MB

english, 2017

26

Investigation of built-in bipolar junction transistor in FD-SOI BIMOS

Bédécarrats, Thomas, Galy, Philippe, Fenouillet-Béranger, Claire, Cristoloveanu, Sorin

Journal:

Solid-State Electronics

Year:

2019

Language:

english

File:

PDF, 1.82 MB

english, 2019

27

Investigation of built-in bipolar junction transistor in FD-SOI BIMOS

Bédécarrats, Thomas, Galy, Philippe, Fenouillet-Béranger, Claire, Cristoloveanu, Sorin

Journal:

Solid-State Electronics

Year:

2019

File:

PDF, 1.82 MB

2019

28

Ultraviolet Nanosecond Laser Annealing for Low Temperature 3D-Sequential Integration Gate Stack

Kerdilès, Sébastien, Acosta-Alba, Pablo, Royet, Anne-Sophie, Lassarre, Jessica, Perrot, Cédric, Aussenac, François, Brunet, Laurent, Fenouillet-Beranger, Claire

Journal:

ECS Transactions

Year:

2019

Language:

english

File:

PDF, 262 KB

english, 2019

29

A BIMOS-based 2T1C analogue spiking neuron circuit integrated in 28nm FD-SOI technology for neuromorphic application

Bédécarrats, Thomas, Fenouillet-Béranger, Claire, Cristoloveanu, Sorin, Galy, Philippe

Journal:

Solid-State Electronics

Year:

2019

File:

PDF, 1.45 MB

2019

30

Ultraviolet Nanosecond Laser Annealing for Low Temperature 3D-Sequential Integration Gate Stack

Kerdilès, Sébastien, Acosta-Alba, Pablo, Royet, Anne-Sophie, Lassarre, Jessica, Perrot, Cédric, Aussenac, François, Brunet, Laurent, Fenouillet-Beranger, Claire

Journal:

ECS Transactions

Year:

2019

File:

PDF, 262 KB

2019

31

[IEEE 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Grenoble, France (2019.4.1-2019.4.3)] 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Thin film BIMOS transistor for low-power spiking neuron design in 28nm FD-SOI CMOS technology

Galy, Philippe, Bedecarrats, Thomas, Fenouillet-Beranger, Claire, Cristoloveanu, Sorin

Year:

2019

Language:

english

File:

PDF, 9.39 MB

english, 2019

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски